Recent hardware and software developments as well as workflow advances have resulted in the scanning
electron microscope (SEM) being paired with various sectioning approaches to enable imaging of large volumes of resin-embedded cells and tissue samples at high speed and with significant automation. These approaches that allow efficient ultrastructural imaging of µm to mm volumes in 3-D and at nm level resolutions, we refer to collectively as volume EM (vEM) techniques.
The heterogeneity inherent to vEM sample preparation, imaging, image processing and analysis steps both underscores the need for, and also complicates establishment of standards in this emerging field.
Guidelines for vEM may help scientists fully exploit new technologies and resources, increase experimental efficiencies and generate and share reliable insights in their research.